May.4, 2015, Platform Design Automation, Inc. annouced the release of industry's fastest 1/f noise characterization solution - . The new solution not only has the fastest measurement speed, it can also measure the noise of really low current such as the dark current noise of photo diodes. "1/f noise is now an important design consideration and with the increasing process variations, it is critical to measure the statistical behavior of device noise, noise characterization system has to be fast enough to provide large statistics in time. NC300 is based on a brand new architect and it is the answer for such requirements", said Albert Li, CEO of PDA. "The integrated design enables the lowest system noise floor and our innovative "self-adjust" technology has enabled NC300 to be suitable for all lab environments".
Contact email@example.com for more information.