DATE(Design Automation And Test in Europe) is one of the top international conferences in the field of integrated circuit design automation and testing, which was held this year in Dresden, Germany, on March 19.
PDA and Tsinghua University’s joint paper《Low-Cost High-Accuracy Variation Characterization for Nanoscale IC Technologies via Novel Learning based Techniques》got the Best Paper Award, First author Zhijian Pan and First correspondent author Albert Li(PDA CEO) attended the award ceremony DATE Party which was held in Deutsches Hygiene-Museum on March 21.
The paper is about the utilization of learning algorithms on semiconductor production test, the core algorithms are validated by more than 150000 real industry 28nm wafer testing curves. The average error is less than 0.1%, max error less than 0.8% under high precision, test efficiency up to 10 to 14 times. PDA has been committed to utilizing algorithms and expertise to accelerate semiconductor test precision, speed and capabilities. At this event, PDA showcased its newly released algorithm-driven semiconductor parameter test solution FS-Pro and the industry's fastest low-frequency noise test system NC300.