The annual GTI Taiwan Seminar was held in Hsinchu on Jun28. PDA’s AI technical talks became the most hot topics of the event. Customers were very impressed by how PDA applied the AI (deep learning) algorithms on accelerating the measurement speed and improving the modeling efficiency.
TOPIC: Time to “Learn” - A Complete Learning-Based Semiconductor Parametric Testing and Device Modeling Ecosystem, from Probing to Simulation
TOPIC: Low-Cost High-Accuracy Variation Characterization for Nanoscale IC Technologies via Novel Learning-based Techniques
TOPIC: FS series, an AI-driven and Modular Device Parametric Test Solution for Fast IV, CV and Low Frequency Noise Measurement