AI Technical Talks At GTI Seminar 2017

Author:博达微Time:2017-06-30Browse:153

The annual GTI Taiwan Seminar was held in Hsinchu on Jun28.  PDA’s AI technical talks became the most hot topics of the event. Customers were very impressed by how PDA applied the AI (deep learning) algorithms on accelerating the measurement speed and improving the modeling efficiency.

TOPIC: Time to “Learn” - A Complete Learning-Based Semiconductor Parametric Testing and Device Modeling Ecosystem, from Probing to Simulation

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TOPIC: Low-Cost High-Accuracy Variation Characterization for Nanoscale IC Technologies via Novel Learning-based Techniques

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TOPIC: FS series, an AI-driven and Modular Device Parametric Test Solution for Fast IV, CV and Low Frequency Noise Measurement

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